| 早 | 期失效寿命试验 | ||
|---|---|---|---|
| Test conditions： | |||
| Stress Voltage | VA= | 3.3 | V |
| S T | TA= | 125 | ℃ |
| tress emperature | KA= | 398 | K |
| Test duration | tA= | 72 | hours |
| Sample size | N= | 3000 | pcs |
| Activation Energy | Ea= | 0.7 | eV |
| γV= | 1 | V-1 | |
| k= | 8.62E-05 | eV/K | |
| AF=AFt*AFv | = | 128.50295 | |
| AFt = exp [(Ea/k) * (1/Kuse – 1/KA)] | = | 77.940979 | |
| AFv=exp [(K/X)(VA–Vuse)]=exp [γV(VA–Vuse)] | = | 1.6487213 | |
| 60% Confidence Level Result： | |||
| Confidence Level(%) | = | 60% | |
| Total Rejects(r) | = | 0 | |
| X^2(%CL,2r+2)= | = | 1.8325815 | |
| λ=[X^2(%CL,2r+2)10^9]/2AFtAN MTTF=1/λ*10^9 |
= = = |
33.01159 30292391 3458.0355 |
FITS Device Hours Device Years |
| ELFR (in ppm per tELF)=[tELF×10-3×ELFR in FIT] | = | 289.18153 | ppm |
Test Sample：1000pcs/3lot(3 non-sequential)